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A Full Life Cycle Defect Process Model That Supports Defect Tracking, Software Product Cycles, And Test Iterations

A journal article published 2015-01-06 by John M. Pfau Library, California State University San Bernardino. It presents a full life-cycle model for managing software defects, product cycles, and test iterations.

Categories: technology, science-and-space

Generated scores

Scores are based on the cited reporting and use a 1–10 scale. Read the methodology.

Confidence
6/10
Geographic reach
1/10
Global importance
2/10
Impact magnitude
2/10
Positivity
6/10
Urgency
1/10

Why it matters

The model supports defect tracking and software product and testing processes.

Sources

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