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A Full Life Cycle Defect Process Model That Supports Defect Tracking, Software Product Cycles, And Test Iterations
A journal article published 2015-01-06 by John M. Pfau Library, California State University San Bernardino. It presents a full life-cycle model for managing software defects, product cycles, and test iterations.
Categories: technology, science-and-space
Generated scores
Scores are based on the cited reporting and use a 1–10 scale. Read the methodology.
- Confidence
- 6/10
- Geographic reach
- 1/10
- Global importance
- 2/10
- Impact magnitude
- 2/10
- Positivity
- 6/10
- Urgency
- 1/10
Why it matters
The model supports defect tracking and software product and testing processes.
Sources
- A Full Life Cycle Defect Process Model That Supports Defect Tracking, Software Product Cycles, And Test IterationsMetadata provided by Crossref. Usage terms

