First published 10/2/2026, 5:28:15 PM · Last updated 10/2/2026, 5:28:15 PM

Deformation and shape measurement using multiple wavelength microscopic TV holography

A journal article published by SPIE in February 2009 that reports using multiple wavelengths with microscopic TV holography to measure deformation and surface shape. The source record supplied is a publisher entry for a journal article.

Illustrative image: Missing fundamental on 1 (dashed), Fourier series. The period which is the least common multiple of all the harmonics is that of the fundamental. Thus even if it itself is missing, the frequency is still perceptible. — Hyacinth/Wikimedia Commons, CC BY-SA 4.0

Categories: science-and-space

Generated scores

Scores are based on the cited reporting and use a 1–10 scale. Read the methodology.

Confidence: 6/10How certain the assessment is based on the clarity and evidence in the cited reporting.
Geographic reach: 1/10How widely the event reaches, from a local area (1) to worldwide impact (10).
Global importance: 3/10The event's broader significance, from limited importance (1) to major global importance (10).
Impact magnitude: 2/10The scale or severity of the real-world impact, from minor (1) to extreme (10).
Positivity: 7/10How harmful or beneficial the event is, from strongly harmful (1) to strongly positive (10).
Urgency: 1/10How time-sensitive the event is, from low urgency (1) to immediate attention needed (10).

Why it matters

The paper documents an optical measurement technique relevant to microscopy and metrology research.

Sources

Deformation and shape measurement using multiple wavelength microscopic TV holography

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