First published · Last updated
Electronic speckle pattern interferometry with thin beam illumination of miniature reflection and transmission "speckling" elements for in-plane deformation measurements
A 1998 SPIE journal article presenting a method using electronic speckle pattern interferometry with thin-beam illumination for measuring in-plane deformations. The excerpt identifies the publisher and content type but provides no experimental results or impact details.
Categories: science-and-space, technology
Generated scores
Scores are based on the cited reporting and use a 1–10 scale. Read the methodology.
- Confidence
- 6/10
- Geographic reach
- 1/10
- Global importance
- 3/10
- Impact magnitude
- 2/10
- Positivity
- 6/10
- Urgency
- 1/10
Why it matters
It documents a technical measurement method in a peer-reviewed engineering optics publication.

