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On-line submicron profile measurements from safe distances with conoscopic holography: feasibility and potential problems

A SPIE journal article reports a feasibility study and discusses potential problems for using conoscopic holography to perform on-line submicron profile measurements from safe distances. The source record is a journal-article entry and contains no operational deployment details.

Categories: science-and-space, technology

Generated scores

Scores are based on the cited reporting and use a 1–10 scale. Read the methodology.

Confidence
5/10
Geographic reach
1/10
Global importance
2/10
Impact magnitude
2/10
Positivity
6/10
Urgency
1/10

Why it matters

The paper evaluates a remote optical measurement technique that could affect how submicron surface profiles are measured.

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