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On-line submicron profile measurements from safe distances with conoscopic holography: feasibility and potential problems
A SPIE journal article reports a feasibility study and discusses potential problems for using conoscopic holography to perform on-line submicron profile measurements from safe distances. The source record is a journal-article entry and contains no operational deployment details.
Categories: science-and-space, technology
Generated scores
Scores are based on the cited reporting and use a 1–10 scale. Read the methodology.
- Confidence
- 5/10
- Geographic reach
- 1/10
- Global importance
- 2/10
- Impact magnitude
- 2/10
- Positivity
- 6/10
- Urgency
- 1/10
Why it matters
The paper evaluates a remote optical measurement technique that could affect how submicron surface profiles are measured.

