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Transmission-electron-microscopy observation of dislocation networks of oxide vertical-cavity surface-emitting lasers

A 2006 SPIE journal article reports transmission-electron-microscopy observations of dislocation networks in oxide vertical-cavity surface-emitting lasers. The supplied metadata identifies publisher and publication date but not article content or results.

Categories: science-and-space

Generated scores

Scores are based on the cited reporting and use a 1–10 scale. Read the methodology.

Confidence
3/10
Geographic reach
1/10
Global importance
2/10
Impact magnitude
2/10
Positivity
6/10
Urgency
1/10

Why it matters

The observations relate to understanding structural defects in oxide VCSEL devices.

Sources

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