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Transmission-electron-microscopy observation of dislocation networks of oxide vertical-cavity surface-emitting lasers
A 2006 SPIE journal article reports transmission-electron-microscopy observations of dislocation networks in oxide vertical-cavity surface-emitting lasers. The supplied metadata identifies publisher and publication date but not article content or results.
Categories: science-and-space
Generated scores
Scores are based on the cited reporting and use a 1–10 scale. Read the methodology.
- Confidence
- 3/10
- Geographic reach
- 1/10
- Global importance
- 2/10
- Impact magnitude
- 2/10
- Positivity
- 6/10
- Urgency
- 1/10
Why it matters
The observations relate to understanding structural defects in oxide VCSEL devices.

